Field Emission Scanning Electron Microscope x 2

Published 07 Jan 2023
Auckland
University of Auckland
Field Emission Scanning Electron Microscope x 2
University of Auckland
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Three systems are requested, to perform high resolution imaging/analysis via an electron source for investigation of a wide range of material samples, including conductive, non-conductive and magnetic/magnetisable specimens. This will be performed for the purpose of research and…

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